Mentor Graphics Deep Submicron Division Launches the Kronos Cell Characterization and Analysis Platf
Mentor Graphics Deep Submicron Division Launches the Kronos Cell Characterization and Analysis Platform
WILSONVILLE, Ore.--(BUSINESS WIRE)-- Mentor Graphics Corp. (NAS: MENT) today announced availability of the Kronos™ Cell Characterization and Analysis platform. The Kronos platform quickly produces accurate performance models for standard cells, I/Os, and complex cells within an advanced, integrated environment. Without correctly characterized libraries, an entire design project may be at risk, and designing at the wrong environmental corner or not taking advantage of a special operating voltage may lead to slower, larger designs that waste power or take longer to close on timing.
At 45nm and below, speed and power consumption are much more sensitive to environmental conditions including voltage and noise. Therefore, producing accurate models at the appropriate conditions is critical to achieving design success. The Kronos platform quickly generates accurate and complete timing/power models and incorporates unique methods for noise immunity and signal integrity to avoid design problems that otherwise might not be detected until failure analysis.
The Kronos Platform's advanced algorithms and efficient job distribution reduces characterization time from weeks to days. During characterization, SPICE simulations are continuously monitored, and numerous data checks and recovery mechanisms significantly improve turn-around time by pinpointing specific model results and simulations if a problem is detected.
Kronos Characterizer is a high-throughput, general purpose cell library characterization tool for standard cells, complex cells, IO pad, and custom macros. The Kronos platform features high-performance integration with the best-in-class Eldo® Classic SPICE simulator. Eldo Classic has been extensively optimized for cell characterization, offering quick simulation turnarounds and the industry's most accurate results. The tight integration of Kronos Characterizer with Eldo Classic delivers improved performance for shorter total characterization time through dedicated features in the Eldo simulator that support library characterization.
Kronos Analyzer is a library analysis and verification tool for ensuring high quality libraries whether qualifying libraries from an external supplier or developing library models internally. The tool enables design engineers and library qualification teams to compare and validate complex ASIC cell libraries for design-critical characteristics such as performance, area, and power. Kronos Analyzer can be used with any cell characterization solution for library validation and optimization.
"Our customers know that sophisticated and robust Standard Cell Library analysis and characterization are of critical importance," said Robert Hum, vice president and general manager, Deep Submicron Division (DSM), Mentor Graphics. "Our SPICE simulator, Eldo, has been optimized for cell characterization and used to drive this type of solution for many years. Now we have the opportunity to deeply integrate Eldo into a best-in-class characterization technology for optimal accuracy and performance."
About Mentor Graphics
Mentor Graphics Corporation is a world leader in electronic hardware and software design solutions, providing products, consulting services and award-winning support for the world's most successful electronic, semiconductor and systems companies. Established in 1981, the company reported revenues in the last fiscal year of about $1,015 million. Corporate headquarters are located at 8005 S.W. Boeckman Road, Wilsonville, Oregon 97070-7777. World Wide Web site: http://www.mentor.com/.
(Mentor Graphics and Eldo are registered trademarks and Kronos is a trademark of Mentor Graphics Corporation. All other company or product names are the registered trademarks or trademarks of their respective owner.)
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