Bruker Releases AFM Zoom Option for 3D Optical Microscopes
Bruker Releases AFM Zoom Option for 3D Optical Microscopes
NanoLens™ Accessory Expands Power of ContourGT Systems
BOSTON--(BUSINESS WIRE)-- Bruker announced today at the 2012 Materials Research Society (MRS) Fall Meeting the release of the unique NanoLens™ Atomic Force Microscope (AFM) accessory for ContourGT® 3D optical microscopes. Designed for fast installation on a new five-position, fully automated turret, the compact NanoLens delivers unprecedented high-resolution imaging capabilities without sacrificing measurement speed in optical modes. With NanoLens, users can perform nanometer-scale surface and material property analysis on the same system that provides the industry's most repeatable and versatile 3D optical microscopy measurements.
Bruker NanoLens (Photo: Business Wire)
"We have addressed a need in industry to combine nanoscale AFM zoom capabilities with high-throughput 3D optical microscopy," said Mark R. Munch, Ph.D., President, Bruker MAT Group and Bruker Nano Surfaces Division. "The NanoLens makes it easy to augment the large field of view, high throughput and unmatched Z-axis resolution of our ContourGT systems with the higher lateral '1000x' resolution of an AFM. This can be exceptionally useful for production line defect analysis and process development, where time spent moving samples between tools means lost productivity and lower yield."
"We focused on making the NanoLens simple to install, operate and maintain. Customers who are familiar with AFM technology will be amazed at how fast and easy it is to connect the NanoLens and begin collecting data," added Rob Loiterman, Executive Vice President and General Manager of Bruker's Stylus and Optical Metrology Business. "With tip changes that take under five minutes combined with the gage-capable 'measurement on demand' design of our 3D optical microscopes, NanoLens ensures fastest time to data for AFM and optical measurement modes."
About the ContourGT 3D Optical Microscopes
The ContourGT line of 3D optical microscopes features patented, higher brightness dual-LED illumination that, when combined with their superior vertical resolution, greatly improves sensitivity and stability. Intuitive Vision64 software provides the industry's easiest to use interface and most powerful measurement and analysis functionality. From nanometer-scale roughness through millimeter-scale steps, with sub-nanometer z-axis resolution, the unmatched analysis capabilities, new color camera option, and NanoLens optional accessory establish the ContourGT systems as the new benchmark for flexibility and capability in surface measurement and imaging.
About Bruker Corporation (NAS: BRKR)
Bruker Corporation is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis. For more information about Bruker Corporation, please visit www.bruker.com.
Photos/Multimedia Gallery Available:http://www.businesswire.com/multimedia/home/20121126005688/en/
Bruker Nano Surfaces Division
Stephen Hopkins, +1 520-741-1044 x1022
Marketing Communications
steve.hopkins@bruker-nano.com
KEYWORDS: United States North America Massachusetts
INDUSTRY KEYWORDS:
The article Bruker Releases AFM Zoom Option for 3D Optical Microscopes originally appeared on Fool.com.
Try any of our Foolish newsletter services free for 30 days. We Fools may not all hold the same opinions, but we all believe that considering a diverse range of insights makes us better investors. The Motley Fool has a disclosure policy.
Copyright © 1995 - 2012 The Motley Fool, LLC. All rights reserved. The Motley Fool has a disclosure policy.
